UGBENE, I. .; TEJERE, I. . Transient sensitivity and Monte Carlo spectral analy- sis in stage-structured manufacturing systems. International Journal of Mathematical Analysis and Modelling, [S. l.], v. 8, n. 1, 2025. Disponível em: https://tnsmb.org/journal/index.php/ijmam/article/view/215. Acesso em: 28 jul. 2026.